As a manufacturer, you are looking for high-resolution SEM analysis: SEM-FEG
What is high-resolution SEM analysis - FEG SEM ?
Using the principle of electron-matter interaction, Scanning Electron Microscopy (SEM) is a state-of-the-art characterization technique that produces high-resolution images of a sample's surface.
Today's Field Emission Gun (FEG) alternative offers the improved performance required for demanding analytical applications and very high resolution.
What are the advantages of the high-resolution SEM-FEG technique ?
Observing the surface of samples at low voltage with an FEG emission source reduces beam penetration and thus improves resolution.
Observation of fine surface structures at very low voltage and very high magnification therefore enables users to reveal the finest surface details. This technique enables magnifications of the order of 1000000 to be achieved.
The FILAB laboratory supports manufacturers in high-resolution SEM analysis (SEM-FEG)
Our services
Fractographic expertise of facies : fracture analysis, fatigue testing
surface treatment characterization: thickness and nature of the stackca
surface studies: oxidation, nitriding treatment, etc.
study of corrosion mechanism
inclusion diagnosis: chemical composition
topographical examination: roughness, wear, friction ...