As a manufacturer, you are interested in FIB SEM analysis
What is FIB SEM analysis ?
FIB SEM is an advanced technique combining a scanning electron microscope (SEM) with a focused ion beam (FIB, for Focused Ion Beam). This technology is used to analyze, image and modify materials at micro and nano scales. Here’s how each component contributes to the instrument’s functionality:
Why perform FIB SEM analysis ?
FIB SEM (Focused Ion Beam coupled to Scanning Electron Microscopy) analysis is beneficial, not least because of its accuracy, versatility and ability to provide detailed information on material structure and composition. Here are some of the main reasons why this technique is used
What are the advantages of FIB SEM analysis ?
FIB SEM is an essential analytical technique for characterizing materials. It provides crucial information on their chemical composition and helps identify the causes of material failure. It has wide applications in sectors ranging from materials science and electronics to medicine, where it is used to create miniaturized medical devices.
The most notable aspect of FIB SEM is its ability to modify and prototype nanoscale structures, which is crucial for the development and repair of miniaturized electronic circuits and components. This technique involves the removal of material, yet its extreme precision ensures that damage to the rest of the sample is minimized, making it a relatively non-destructive method. In short, FIB SEM analysis is a pillar in the quest for understanding, innovation and quality assurance in many industrial fields.
FILAB can help you with your FIB SEM analysis
Why choose FILAB for your FIB SEM analysis ?
Examples of applications for FIB SEM analysis, specific to your field of activity :
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FAQ
FIB SEM is used for failure analysis, materials characterization, microstructural studies, defect investigation and nanoscale prototyping.
Unlike conventional SEM, FIB SEM integrates an ion beam that can mill, cut or modify the sample. This enables internal cross-section analysis and 3D reconstruction, which are not possible with standard SEM alone.
FIB SEM is considered a localized and minimally destructive technique. Material removal is extremely precise and limited to targeted areas, preserving the rest of the sample for further analysis if required.
FIB SEM analysis is suitable for metals, alloys, polymers, ceramics, electronic components, coatings, thin films and composite materials.
FIB SEM is widely used in fine chemicals, surface treatment, cosmetics, pharmaceuticals, medical devices, metallurgy, automotive, aerospace, nuclear and luxury industries.
FILAB offers advanced FIB SEM instrumentation combined with over 30 years of expertise in materials characterization. The laboratory provides tailored sample preparation, high-resolution imaging and fully interpreted reports adapted to industrial challenges.
You can request a quote by contacting us through our contact form on the right or by email with details about your project. We will respond shortly with a customized proposal.