Your needs: control the level of surface cleanliness of a product
For many application sectors (medical, energy, aeronautics, automotive, electronics, …), the lifespan and functionality of a product are directly linked to the level of chemical contamination and particulate pollution present on the surface following the various stages of the manufacturing process.
In order to guarantee the surface cleanliness of a product and therefore its quality, it is therefore essential to set up a cleaning program specific to the substances used in the manufacturing process of the article.
To evaluate the cleanliness of a surface, the preferred technique is that of Scanning Electron Microscopy (SEM-FEG) coupled with an EDX microprobe. This approach has the advantage of being able to map the spatial distribution of contaminants on the surface of the part.
This approach has the advantage of being able to map the spatial distribution of contaminants on the surface of the part.
FILAB provides you with a state-of-the-art SEM-FEG-EDX to evaluate your surface properties
From analysis to R&D, including expertise and validation of cleaning processes, the FILAB laboratory offers a multi-sectoral expertise for several types of requests related to the surface cleanliness of materials:
Our expertise
Particle and chemical mapping by SEM-FEG-EDX of the surface of aerospace components (metallic and ceramic) following a customer methodology transposed and validated in our laboratory
Analysis of the particulate cleanliness of turned parts for the aeronautical and automotive sectors according to ISO 16232 and VDA19 standards
Particulate contamination in injectable products and parenteral infusions (USP 788, PE 2.9.19 method 2, ...)
Analysis and control of gravimetry (according to the standard NF E 48-652)
Particle Counting according to the standard E-48-660 and ISO 4406
Control of the surface condition by SEM-FEG-EDX of dental implants after treatment to search for organic contamination and residues of surface treatment such as blasting, sandblasting, ... (Clean Implant)
Particulate contamination and chemical characterization of medical devices according to ISO 10993, ISO 19227
Identification of the nature of particles by SEM-FEG-EDX and FTIR microscopy in pharmaceutical solutions.
Particle identification by SEM-EDX or OM according to the standards NF E 48-651 and 48-660
Other analytical techniques can be used to evaluate the cleanliness of a surface such as µ-IRTF, X-ray Photoelectron Spectroscopy (XPS) and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS), Chromatography techniques (GC-FID, GCMS, LCMS, …), elemental analysis (ICP-AES, ICP-MS, CLI)…